17th IMEKO World Congress on Metrology in the 3rd Millennium, Dubrovnik (Croatia). 22-27 June 2003
Summary:
No disponible/Not available
Keywords: No disponible/Not available
Publication date: 2003-06-22.
Citation:
M. Carpentieri, J. Silveira, R. Giannetti, A system for monitoring the spatial and intensity distribution on CCD patterns applied to in situ characterization, 17th IMEKO World Congress on Metrology in the 3rd Millennium, Dubrovnik (Croatia). 22-27 June 2003.
